Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution. / Aryshev, Alexander; Ainsworth, Rob; Aumeyr, Thomas; Bergamaschi, Michele; Boogert, Stewart ; Karataev, Pavel; Kieffer, Robert; Kruchinin, Konstantin; Lefevre, Thibaut; Mazzoni, Stefano; Nevay, Laurence; Terunuma, Nobuhiro; Urakawa, Junji.

In: Journal of Instrumentation, Vol. 15, P01020, 17.01.2020, p. 1-18.

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article numberP01020
Pages (from-to)1-18
Number of pages18
JournalJournal of Instrumentation
Publication statusPublished - 17 Jan 2020
This open access research output is licenced under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License.

ID: 35227964