Original language | English |
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Article number | P01020 |
Pages (from-to) | 1-18 |
Number of pages | 18 |
Journal | Journal of Instrumentation |
Volume | 15 |
DOIs | |
Publication status | Published - 17 Jan 2020 |
Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution
Alexander Aryshev, Rob Ainsworth, Thomas Aumeyr, Michele Bergamaschi, Stewart Boogert, Pavel Karataev, Robert Kieffer, Konstantin Kruchinin, Thibaut Lefevre, Stefano Mazzoni, Laurence Nevay, Nobuhiro Terunuma, Junji Urakawa
Research output: Contribution to journal › Article › peer-review
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