SUB-MICROMETER RESOLUTION TRANSVERSE ELECTRON BEAM SIZE MEASUREMENT SYSTEM BASED ON OPTICAL TRANSITION RADIATION

Stewart Boogert, Alexander Aryshev, Nobuhiro Terunuma, Junji Urakawa, Pavel Karataev, David Howell

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Abstract

Optical Transition Radiation (OTR) appearing when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by so-called Point Spread Function (PSF) dimension - the source distribution generated by a single electron and projected by an optical system onto a screen. In our experiment we managed to create a system which can practically measure the PSF distribution. We demonstrated that it is non-uniform. In this paper we represent the development of a novel sub-micrometer electron beam profile monitor based on the measurements of the PSF structure which visibility is sensitive to micrometer electron beam dimensions. In this report the recent experimental results and the future plans on the optimization of the monitor are presented.
Original languageEnglish
Title of host publicationProceedings of IPAC'10, Kyoto, Japan
Publication statusPublished - 2010

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