Microstructure and Properties of Artificial Grain-Boundaries in Epitaxial Yba2cu3o7-Delta Thin-Films Grown on [001] Tilt Y-Zro2 Bicrystals

J. A. Alarco; E. Olsson; Z. G. Ivanov; D. Winkler; E. A. Stepantsov; O. I. Lebedev; A. L. Vasiliev; A. Y. Tzalenchuk; N. A. Kiselev

Microstructure and Properties of Artificial Grain-Boundaries in Epitaxial Yba2cu3o7-Delta Thin-Films Grown on [001] Tilt Y-Zro2 Bicrystals

J. A. Alarco, E. Olsson, Z. G. Ivanov, D. Winkler, E. A. Stepantsov, O. I. Lebedev, A. L. Vasiliev, A. Y. Tzalenchuk, N. A. Kiselev

Department of Physics

Research output: Contribution to journal › Article › peer-review

Abstract

The microstructure of artificial grain boundaries in YBa2Cu3O7-delta (YBCO) thin films grown on [001] tilt Y-ZrO2 (YSZ) bicrystal substrates has been characterized using transmission electron microscopy and atomic force microscopy. Despite a relatively straight morphology of the substrate boundaries, the film boundaries were wavy. The waviness was a result of the combined effects of grooving at the substrate boundaries prior to the film deposition and an island-growth mechanism for YBCO on YSZ substrates. The dihedral angle of the groove walls varied with the misorientation angle and depended on the symmetry of the substrate boundary. The amplitudes of the film boundary waviness compared well with the widths of the grooves. In addition, the grooves induced local bending of the YBCO lattice planes and additional tilt components perpendicular to the c-axis close to the film boundaries.

Original language	English
Pages (from-to)	263-279
Number of pages	17
Journal	Physica C: Superconductivity and its Applications
Volume	247
Issue number	3-4
Publication status	Published - 1995

Cite this

@article{04118611e6464b6ca8b81b9c3393a872,

title = "Microstructure and Properties of Artificial Grain-Boundaries in Epitaxial Yba2cu3o7-Delta Thin-Films Grown on [001] Tilt Y-Zro2 Bicrystals",

abstract = "The microstructure of artificial grain boundaries in YBa2Cu3O7-delta (YBCO) thin films grown on [001] tilt Y-ZrO2 (YSZ) bicrystal substrates has been characterized using transmission electron microscopy and atomic force microscopy. Despite a relatively straight morphology of the substrate boundaries, the film boundaries were wavy. The waviness was a result of the combined effects of grooving at the substrate boundaries prior to the film deposition and an island-growth mechanism for YBCO on YSZ substrates. The dihedral angle of the groove walls varied with the misorientation angle and depended on the symmetry of the substrate boundary. The amplitudes of the film boundary waviness compared well with the widths of the grooves. In addition, the grooves induced local bending of the YBCO lattice planes and additional tilt components perpendicular to the c-axis close to the film boundaries.",

author = "Alarco, {J. A.} and E. Olsson and Ivanov, {Z. G.} and D. Winkler and Stepantsov, {E. A.} and Lebedev, {O. I.} and Vasiliev, {A. L.} and Tzalenchuk, {A. Y.} and Kiselev, {N. A.}",

year = "1995",

language = "English",

volume = "247",

pages = "263--279",

journal = "Physica C: Superconductivity and its Applications",

issn = "1873-2143",

publisher = "Elsevier",

number = "3-4",

}

TY - JOUR

T1 - Microstructure and Properties of Artificial Grain-Boundaries in Epitaxial Yba2cu3o7-Delta Thin-Films Grown on [001] Tilt Y-Zro2 Bicrystals

AU - Alarco, J. A.

AU - Olsson, E.

AU - Ivanov, Z. G.

AU - Winkler, D.

AU - Stepantsov, E. A.

AU - Lebedev, O. I.

AU - Vasiliev, A. L.

AU - Tzalenchuk, A. Y.

AU - Kiselev, N. A.

PY - 1995

Y1 - 1995

N2 - The microstructure of artificial grain boundaries in YBa2Cu3O7-delta (YBCO) thin films grown on [001] tilt Y-ZrO2 (YSZ) bicrystal substrates has been characterized using transmission electron microscopy and atomic force microscopy. Despite a relatively straight morphology of the substrate boundaries, the film boundaries were wavy. The waviness was a result of the combined effects of grooving at the substrate boundaries prior to the film deposition and an island-growth mechanism for YBCO on YSZ substrates. The dihedral angle of the groove walls varied with the misorientation angle and depended on the symmetry of the substrate boundary. The amplitudes of the film boundary waviness compared well with the widths of the grooves. In addition, the grooves induced local bending of the YBCO lattice planes and additional tilt components perpendicular to the c-axis close to the film boundaries.

AB - The microstructure of artificial grain boundaries in YBa2Cu3O7-delta (YBCO) thin films grown on [001] tilt Y-ZrO2 (YSZ) bicrystal substrates has been characterized using transmission electron microscopy and atomic force microscopy. Despite a relatively straight morphology of the substrate boundaries, the film boundaries were wavy. The waviness was a result of the combined effects of grooving at the substrate boundaries prior to the film deposition and an island-growth mechanism for YBCO on YSZ substrates. The dihedral angle of the groove walls varied with the misorientation angle and depended on the symmetry of the substrate boundary. The amplitudes of the film boundary waviness compared well with the widths of the grooves. In addition, the grooves induced local bending of the YBCO lattice planes and additional tilt components perpendicular to the c-axis close to the film boundaries.

M3 - Article

SN - 1873-2143

VL - 247

SP - 263

EP - 279

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

IS - 3-4

ER -