The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. / Naumenko, G ; Potylitsyn, A ; Araki, S ; Aryshev, A ; Hayano, H ; Karataev, Pavel; Muto, T ; Urakawa, J ; Ross, M ; Cline, D ; Fukui, Y ; Hamatsu, R .

IEEE. 2005. p. 2554-2556.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Published
  • G Naumenko
  • A Potylitsyn
  • S Araki
  • A Aryshev
  • H Hayano
  • Pavel Karataev
  • T Muto
  • J Urakawa
  • M Ross
  • D Cline
  • Y Fukui
  • R Hamatsu
Original languageEnglish
Title of host publicationIEEE
Pages2554-2556
Number of pages3
Publication statusPublished - 2005

ID: 409236