The possibility of noninvasive micron high energy electron beam size measurement using diffraction radiation. / Naumenko, G ; Potylitsyn, A ; Araki, S ; Aryshev, A ; Hayano, H ; Karataev, Pavel; Muto, T ; Urakawa, J ; Ross, M ; Cline, D ; Fukui, Y ; Hamatsu, R .
IEEE. 2005. p. 2554-2556.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Published
| Original language | English |
|---|---|
| Title of host publication | IEEE |
| Pages | 2554-2556 |
| Number of pages | 3 |
| Publication status | Published - 2005 |
ID: 409236