Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology. / He, Hans; Lara-Avila, Samuel; Kim, Kyung Ho; Fletcher, Nick; Rozhko, Sergiy; Bergsten, Tobias; Eklund, Gunnar; Cedergren, Karin; Yakimova, Rositsa; Park, Yung Woo; Tzalenchuk, Alexander; Kubatkin, Sergey.

In: Metrologia, Vol. 56, No. 4, 045004, 28.06.2019.

Research output: Contribution to journalArticle

Published
  • Hans He
  • Samuel Lara-Avila
  • Kyung Ho Kim
  • Nick Fletcher
  • Sergiy Rozhko
  • Tobias Bergsten
  • Gunnar Eklund
  • Karin Cedergren
  • Rositsa Yakimova
  • Yung Woo Park
  • Alexander Tzalenchuk
  • Sergey Kubatkin
Original languageEnglish
Article number045004
JournalMetrologia
Volume56
Issue number4
Early online date10 Jun 2019
DOIs
Publication statusPublished - 28 Jun 2019
This open access research output is licenced under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License.

ID: 34470902