Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology. / He, Hans; Lara-Avila, Samuel; Kim, Kyung Ho; Fletcher, Nick; Rozhko, Sergiy; Bergsten, Tobias; Eklund, Gunnar; Cedergren, Karin; Yakimova, Rositsa; Park, Yung Woo; Tzalenchuk, Alexander; Kubatkin, Sergey.
In: Metrologia, Vol. 56, No. 4, 045004, 28.06.2019.Research output: Contribution to journal › Article
Original language | English |
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Article number | 045004 |
Journal | Metrologia |
Volume | 56 |
Issue number | 4 |
Early online date | 10 Jun 2019 |
DOIs | |
Publication status | Published - 28 Jun 2019 |
ID: 34470902