One-round key exchange in the standard model. / Boyd, C.; Cliff, Y.; Nieto, J.M. Gonzalez; Paterson, K.G.
In: International Journal of Applied Cryptography, Vol. 1, No. 3, 2009, p. 181-199.Research output: Contribution to journal › Article › peer-review
Original language | English |
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Pages (from-to) | 181-199 |
Number of pages | 19 |
Journal | International Journal of Applied Cryptography |
Volume | 1 |
Issue number | 3 |
Publication status | Published - 2009 |
ID: 1312481