One-round key exchange in the standard model. / Boyd, C.; Cliff, Y.; Nieto, J.M. Gonzalez; Paterson, K.G.

In: International Journal of Applied Cryptography, Vol. 1, No. 3, 2009, p. 181-199.

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)181-199
Number of pages19
JournalInternational Journal of Applied Cryptography
Issue number3
Publication statusPublished - 2009

ID: 1312481