Original language | English |
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Pages (from-to) | 181-199 |
Number of pages | 19 |
Journal | International Journal of Applied Cryptography |
Volume | 1 |
Issue number | 3 |
Publication status | Published - 2009 |
One-round key exchange in the standard model
C. Boyd, Y. Cliff, J.M. Gonzalez Nieto, K.G. Paterson
Research output: Contribution to journal › Article › peer-review