Three dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis

Bernd Minnich, Hannes Leeb, Edward W.N. Bernroider, A. Lametschwandtner

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)23-34
JournalJournal of Microscopy
Issue number1
Publication statusPublished - 1999

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