Original language | English |
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Pages (from-to) | 23-34 |
Journal | Journal of Microscopy |
Volume | 195 |
Issue number | 1 |
Publication status | Published - 1999 |
Three dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis
Bernd Minnich, Hannes Leeb, Edward W.N. Bernroider, A. Lametschwandtner
Research output: Contribution to journal › Article › peer-review