Quantization from Bayes factors with application to multilevel thresholding

F. Murtagh; J.L. Starck

doi:10.1016/S0167-8655(03)00038-2

Quantization from Bayes factors with application to multilevel thresholding

F. Murtagh, J.L. Starck

Department of Computer Science

Research output: Contribution to journal › Article

34 Downloads (Pure)

Original language	English
Pages (from-to)	2001-2007
Journal	Pattern Recognition Letters
Volume	24
Issue number	12
DOIs	https://doi.org/10.1016/S0167-8655(03)00038-2
Publication status	Published - 2003

Keywords

Image thresholding
Model selection
Bayes factor
Bayes information criterion
Edge detection
Wavelet transform

Access to Document

10.1016/S0167-8655(03)00038-2

Full TextSubmitted manuscript, 536 KB

http://www.sciencedirect.com/science/journal/01678655

Cite this

@article{6c226cb2a77542c99dbb696906d5debb,

title = "Quantization from Bayes factors with application to multilevel thresholding",

keywords = "Image thresholding, Model selection, Bayes factor, Bayes information criterion, Edge detection, Wavelet transform",

author = "F. Murtagh and J.L. Starck",

year = "2003",

doi = "10.1016/S0167-8655(03)00038-2",

language = "English",

volume = "24",

pages = "2001--2007",

journal = "Pattern Recognition Letters",

issn = "0167-8655",

publisher = "Elsevier",

number = "12",

}

TY - JOUR

T1 - Quantization from Bayes factors with application to multilevel thresholding

AU - Murtagh, F.

AU - Starck, J.L.

PY - 2003

Y1 - 2003

KW - Image thresholding

KW - Model selection

KW - Bayes factor

KW - Bayes information criterion

KW - Edge detection

KW - Wavelet transform

U2 - 10.1016/S0167-8655(03)00038-2

DO - 10.1016/S0167-8655(03)00038-2

M3 - Article

SN - 0167-8655

VL - 24

SP - 2001

EP - 2007

JO - Pattern Recognition Letters

JF - Pattern Recognition Letters

IS - 12

ER -