Cross-entropy optimisation of importance sampling parameters for statistical model checking

Cyrille Jegourel; A. Legay; Sean Sedwards

doi:10.1007/978-3-642-31424-7_26

Cross-entropy optimisation of importance sampling parameters for statistical model checking

Cyrille Jegourel, A. Legay, Sean Sedwards

Department of Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English
Title of host publication	Computer Aided Verification
Subtitle of host publication	Proceedings of the 24th International Conference, CAV 2012, Berkeley, CA, USA, July 7-13, 2012
Editors	P. Madhusudan, Sanjit A. Seshia
Publisher	Springer-Verlag
Pages	327-342
Number of pages	16
ISBN (Electronic)	978-3-642-31424-7
ISBN (Print)	978-3-642-31423-0
DOIs	https://doi.org/10.1007/978-3-642-31424-7_26
Publication status	Published - 1 Jan 2012

Publication series

Name	Lecture Notes in Computer Science
Volume	7358
ISSN (Print)	0302-9743

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10.1007/978-3-642-31424-7_26

http://link.springer.com/chapter/10.1007%2F978-3-642-31424-7_26

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Jegourel, C., Legay, A., & Sedwards, S. (2012). Cross-entropy optimisation of importance sampling parameters for statistical model checking. In P. Madhusudan, & S. A. Seshia (Eds.), Computer Aided Verification: Proceedings of the 24th International Conference, CAV 2012, Berkeley, CA, USA, July 7-13, 2012 (pp. 327-342). (Lecture Notes in Computer Science; Vol. 7358). Springer-Verlag. https://doi.org/10.1007/978-3-642-31424-7_26

Jegourel, Cyrille ; Legay, A. ; Sedwards, Sean. / Cross-entropy optimisation of importance sampling parameters for statistical model checking. Computer Aided Verification: Proceedings of the 24th International Conference, CAV 2012, Berkeley, CA, USA, July 7-13, 2012. editor / P. Madhusudan ; Sanjit A. Seshia. Springer-Verlag, 2012. pp. 327-342 (Lecture Notes in Computer Science).

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Jegourel, C, Legay, A & Sedwards, S 2012, Cross-entropy optimisation of importance sampling parameters for statistical model checking. in P Madhusudan & SA Seshia (eds), Computer Aided Verification: Proceedings of the 24th International Conference, CAV 2012, Berkeley, CA, USA, July 7-13, 2012. Lecture Notes in Computer Science, vol. 7358, Springer-Verlag, pp. 327-342. https://doi.org/10.1007/978-3-642-31424-7_26

Cross-entropy optimisation of importance sampling parameters for statistical model checking. / Jegourel, Cyrille; Legay, A.; Sedwards, Sean.
Computer Aided Verification: Proceedings of the 24th International Conference, CAV 2012, Berkeley, CA, USA, July 7-13, 2012. ed. / P. Madhusudan; Sanjit A. Seshia. Springer-Verlag, 2012. p. 327-342 (Lecture Notes in Computer Science; Vol. 7358).

Research output: Chapter in Book/Report/Conference proceeding › Chapter

TY - CHAP

T1 - Cross-entropy optimisation of importance sampling parameters for statistical model checking

AU - Jegourel, Cyrille

AU - Legay, A.

AU - Sedwards, Sean

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BT - Computer Aided Verification

A2 - Madhusudan, P.

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Jegourel C, Legay A, Sedwards S. Cross-entropy optimisation of importance sampling parameters for statistical model checking. In Madhusudan P, Seshia SA, editors, Computer Aided Verification: Proceedings of the 24th International Conference, CAV 2012, Berkeley, CA, USA, July 7-13, 2012. Springer-Verlag. 2012. p. 327-342. (Lecture Notes in Computer Science). doi: 10.1007/978-3-642-31424-7_26

Cross-entropy optimisation of importance sampling parameters for statistical model checking

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