Bayes factors for edge detection from wavelet product spaces

F. Murtagh, J.L. Starck

Research output: Contribution to journalArticle

47 Downloads (Pure)
Original languageEnglish
Pages (from-to)1375-1382
JournalOptical Engineering
Volume42
DOIs
Publication statusPublished - May 2003

Keywords

  • Interband wavelet
  • Markov-field
  • Bayes factors

Cite this