Wavelet and curvelet moments for image classification: application to aggregate mixture grading. / Murtagh, Fionn; Starck, Jean-Luc.

In: Pattern Recognition Letters, Vol. 29, No. 10, 15.07.2008, p. 1557-1564.

Research output: Contribution to journalArticlepeer-review

Published

Standard

Wavelet and curvelet moments for image classification: application to aggregate mixture grading. / Murtagh, Fionn; Starck, Jean-Luc.

In: Pattern Recognition Letters, Vol. 29, No. 10, 15.07.2008, p. 1557-1564.

Research output: Contribution to journalArticlepeer-review

Harvard

Murtagh, F & Starck, J-L 2008, 'Wavelet and curvelet moments for image classification: application to aggregate mixture grading', Pattern Recognition Letters, vol. 29, no. 10, pp. 1557-1564. https://doi.org/doi:10.1016/j.patrec.2008.03.008

APA

Vancouver

Author

Murtagh, Fionn ; Starck, Jean-Luc. / Wavelet and curvelet moments for image classification: application to aggregate mixture grading. In: Pattern Recognition Letters. 2008 ; Vol. 29, No. 10. pp. 1557-1564.

BibTeX

@article{5d22df766da44435a35e77642422d8a8,
title = "Wavelet and curvelet moments for image classification: application to aggregate mixture grading",
keywords = "image grading, wavelet and curvelet transforms,<br />moments, variance, skewness, kurtosis.",
author = "Fionn Murtagh and Jean-Luc Starck",
note = "The eprint is the authors' final draft. <br /> Copyright 2008 Elsevier B.V.",
year = "2008",
month = jul,
day = "15",
doi = "doi:10.1016/j.patrec.2008.03.008",
language = "English",
volume = "29",
pages = "1557--1564",
journal = "Pattern Recognition Letters",
issn = "0167-8655",
publisher = "Elsevier",
number = "10",

}

RIS

TY - JOUR

T1 - Wavelet and curvelet moments for image classification: application to aggregate mixture grading

AU - Murtagh, Fionn

AU - Starck, Jean-Luc

N1 - The eprint is the authors' final draft. <br /> Copyright 2008 Elsevier B.V.

PY - 2008/7/15

Y1 - 2008/7/15

KW - image grading

KW - wavelet and curvelet transforms,<br />moments

KW - variance

KW - skewness

KW - kurtosis.

U2 - doi:10.1016/j.patrec.2008.03.008

DO - doi:10.1016/j.patrec.2008.03.008

M3 - Article

VL - 29

SP - 1557

EP - 1564

JO - Pattern Recognition Letters

JF - Pattern Recognition Letters

SN - 0167-8655

IS - 10

ER -