Wavelet and curvelet moments for image classification: application to aggregate mixture grading. / Murtagh, Fionn; Starck, Jean-Luc.

In: Pattern Recognition Letters, Vol. 29, No. 10, 15.07.2008, p. 1557-1564.

Research output: Contribution to journalArticlepeer-review

Published

Documents

  • Full Text

    Submitted manuscript, 904 KB, PDF document

Links

  • Fionn Murtagh
  • Jean-Luc Starck
Original languageEnglish
Pages (from-to)1557-1564
JournalPattern Recognition Letters
Volume29
Issue number10
DOIs
Publication statusPublished - 15 Jul 2008
This open access research output is licenced under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License.

ID: 885498