Wavelet and curvelet moments for image classification: application to aggregate mixture grading. / Murtagh, Fionn; Starck, Jean-Luc.
In: Pattern Recognition Letters, Vol. 29, No. 10, 15.07.2008, p. 1557-1564.Research output: Contribution to journal › Article › peer-review
Published
| Original language | English |
|---|---|
| Pages (from-to) | 1557-1564 |
| Journal | Pattern Recognition Letters |
| Volume | 29 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 15 Jul 2008 |
This open access research output is licenced under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License.
ID: 885498