Wavelet and curvelet moments for image classification: application to aggregate mixture grading. / Murtagh, Fionn; Starck, Jean-Luc.
In: Pattern Recognition Letters, Vol. 29, No. 10, 15.07.2008, p. 1557-1564.Research output: Contribution to journal › Article › peer-review
Original language | English |
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Pages (from-to) | 1557-1564 |
Journal | Pattern Recognition Letters |
Volume | 29 |
Issue number | 10 |
DOIs | |
Publication status | Published - 15 Jul 2008 |
ID: 885498