Three dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis. / Minnich, Bernd; Leeb, Hannes; Bernroider, Edward W.N.; Lametschwandtner, A.

In: Journal of Microscopy, Vol. 195, No. 1, 1999, p. 23-34.

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Three dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis. / Minnich, Bernd; Leeb, Hannes; Bernroider, Edward W.N.; Lametschwandtner, A.

In: Journal of Microscopy, Vol. 195, No. 1, 1999, p. 23-34.

Research output: Contribution to journalArticlepeer-review

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@article{94d6ae30f4e244d1bd06fd0f06b966a4,
title = "Three dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis",
author = "Bernd Minnich and Hannes Leeb and Bernroider, {Edward W.N.} and A. Lametschwandtner",
year = "1999",
language = "English",
volume = "195",
pages = "23--34",
journal = "Journal of Microscopy",
number = "1",

}

RIS

TY - JOUR

T1 - Three dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis

AU - Minnich, Bernd

AU - Leeb, Hannes

AU - Bernroider, Edward W.N.

AU - Lametschwandtner, A.

PY - 1999

Y1 - 1999

M3 - Article

VL - 195

SP - 23

EP - 34

JO - Journal of Microscopy

JF - Journal of Microscopy

IS - 1

ER -