Three dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis. / Minnich, Bernd; Leeb, Hannes; Bernroider, Edward W.N.; Lametschwandtner, A.

In: Journal of Microscopy, Vol. 195, No. 1, 1999, p. 23-34.

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)23-34
JournalJournal of Microscopy
Issue number1
Publication statusPublished - 1999

ID: 619524