Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution

Alexander Aryshev; Rob Ainsworth; Thomas Aumeyr; Michele Bergamaschi; Stewart  Boogert; Pavel Karataev; Robert Kieffer; Konstantin Kruchinin; Thibaut Lefevre; Stefano Mazzoni; Laurence Nevay; Nobuhiro Terunuma; Junji Urakawa

doi:10.1088/1748-0221/15/01/P01020

Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution

Alexander Aryshev, Rob Ainsworth, Thomas Aumeyr, Michele Bergamaschi, Stewart Boogert, Pavel Karataev, Robert Kieffer, Konstantin Kruchinin, Thibaut Lefevre, Stefano Mazzoni, Laurence Nevay, Nobuhiro Terunuma, Junji Urakawa

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Original language	English
Article number	P01020
Pages (from-to)	1-18
Number of pages	18
Journal	Journal of Instrumentation
Volume	15
DOIs	https://doi.org/10.1088/1748-0221/15/01/P01020
Publication status	Published - 17 Jan 2020

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10.1088/1748-0221/15/01/P01020Licence: CC BY

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Aryshev, A., Ainsworth, R., Aumeyr, T., Bergamaschi, M., Boogert, S., Karataev, P., Kieffer, R., Kruchinin, K., Lefevre, T., Mazzoni, S., Nevay, L., Terunuma, N., & Urakawa, J. (2020). Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution. Journal of Instrumentation, 15, 1-18. Article P01020. https://doi.org/10.1088/1748-0221/15/01/P01020

@article{bf992d42fb14436687747d1453246fa7,

title = "Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution",

author = "Alexander Aryshev and Rob Ainsworth and Thomas Aumeyr and Michele Bergamaschi and Stewart Boogert and Pavel Karataev and Robert Kieffer and Konstantin Kruchinin and Thibaut Lefevre and Stefano Mazzoni and Laurence Nevay and Nobuhiro Terunuma and Junji Urakawa",

year = "2020",

month = jan,

day = "17",

doi = "10.1088/1748-0221/15/01/P01020",

language = "English",

volume = "15",

pages = "1--18",

journal = "Journal of Instrumentation",

issn = "1748-0221",

publisher = "IOP Publishing Ltd.",

}

Aryshev, A, Ainsworth, R, Aumeyr, T, Bergamaschi, M, Boogert, S , Karataev, P, Kieffer, R, Kruchinin, K, Lefevre, T, Mazzoni, S, Nevay, L, Terunuma, N & Urakawa, J 2020, 'Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution', Journal of Instrumentation, vol. 15, P01020, pp. 1-18. https://doi.org/10.1088/1748-0221/15/01/P01020

TY - JOUR

T1 - Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution

AU - Aryshev, Alexander

AU - Ainsworth, Rob

AU - Aumeyr, Thomas

AU - Bergamaschi, Michele

AU - Boogert, Stewart

AU - Karataev, Pavel

AU - Kieffer, Robert

AU - Kruchinin, Konstantin

AU - Lefevre, Thibaut

AU - Mazzoni, Stefano

AU - Nevay, Laurence

AU - Terunuma, Nobuhiro

AU - Urakawa, Junji

PY - 2020/1/17

Y1 - 2020/1/17

U2 - 10.1088/1748-0221/15/01/P01020

DO - 10.1088/1748-0221/15/01/P01020

M3 - Article

SN - 1748-0221

VL - 15

SP - 1

EP - 18

JO - Journal of Instrumentation

JF - Journal of Instrumentation

M1 - P01020

ER -