Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution. / Aryshev, Alexander; Ainsworth, Rob; Aumeyr, Thomas; Bergamaschi, Michele; Boogert, Stewart ; Karataev, Pavel; Kieffer, Robert; Kruchinin, Konstantin; Lefevre, Thibaut; Mazzoni, Stefano; Nevay, Laurence; Terunuma, Nobuhiro; Urakawa, Junji.

In: Journal of Instrumentation, Vol. 15, P01020, 17.01.2020, p. 1-18.

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Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution. / Aryshev, Alexander; Ainsworth, Rob; Aumeyr, Thomas; Bergamaschi, Michele; Boogert, Stewart ; Karataev, Pavel; Kieffer, Robert; Kruchinin, Konstantin; Lefevre, Thibaut; Mazzoni, Stefano; Nevay, Laurence; Terunuma, Nobuhiro; Urakawa, Junji.

In: Journal of Instrumentation, Vol. 15, P01020, 17.01.2020, p. 1-18.

Research output: Contribution to journalArticlepeer-review

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@article{bf992d42fb14436687747d1453246fa7,
title = "Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution",
author = "Alexander Aryshev and Rob Ainsworth and Thomas Aumeyr and Michele Bergamaschi and Stewart Boogert and Pavel Karataev and Robert Kieffer and Konstantin Kruchinin and Thibaut Lefevre and Stefano Mazzoni and Laurence Nevay and Nobuhiro Terunuma and Junji Urakawa",
year = "2020",
month = jan,
day = "17",
doi = "10.1088/1748-0221/15/01/P01020",
language = "English",
volume = "15",
pages = "1--18",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "IOP Publishing Ltd.",

}

RIS

TY - JOUR

T1 - Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution

AU - Aryshev, Alexander

AU - Ainsworth, Rob

AU - Aumeyr, Thomas

AU - Bergamaschi, Michele

AU - Boogert, Stewart

AU - Karataev, Pavel

AU - Kieffer, Robert

AU - Kruchinin, Konstantin

AU - Lefevre, Thibaut

AU - Mazzoni, Stefano

AU - Nevay, Laurence

AU - Terunuma, Nobuhiro

AU - Urakawa, Junji

PY - 2020/1/17

Y1 - 2020/1/17

U2 - 10.1088/1748-0221/15/01/P01020

DO - 10.1088/1748-0221/15/01/P01020

M3 - Article

VL - 15

SP - 1

EP - 18

JO - Journal of Instrumentation

JF - Journal of Instrumentation

SN - 1748-0221

M1 - P01020

ER -