SUB-MICROMETER RESOLUTION TRANSVERSE ELECTRON BEAM SIZE MEASUREMENT SYSTEM BASED ON OPTICAL TRANSITION RADIATION. / Boogert, Stewart; Aryshev, Alexander; Terunuma, Nobuhiro; Urakawa, Junji; Karataev, Pavel; Howell, David.
Proceedings of IPAC'10, Kyoto, Japan. 2010.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Submitted manuscript, 749 KB, PDF document
Original language | English |
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Title of host publication | Proceedings of IPAC'10, Kyoto, Japan |
Publication status | Published - 2010 |
ID: 101901