Quantization from Bayes factors with application to multilevel thresholding. / Murtagh, F.; Starck, J.L.

In: Pattern Recognition Letters, Vol. 24, No. 12, 2003, p. 2001-2007.

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Quantization from Bayes factors with application to multilevel thresholding. / Murtagh, F.; Starck, J.L.

In: Pattern Recognition Letters, Vol. 24, No. 12, 2003, p. 2001-2007.

Research output: Contribution to journalArticle

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Murtagh, F. ; Starck, J.L. / Quantization from Bayes factors with application to multilevel thresholding. In: Pattern Recognition Letters. 2003 ; Vol. 24, No. 12. pp. 2001-2007.

BibTeX

@article{6c226cb2a77542c99dbb696906d5debb,
title = "Quantization from Bayes factors with application to multilevel thresholding",
keywords = "Image thresholding, Model selection, Bayes factor, Bayes information criterion, Edge detection, Wavelet transform",
author = "F. Murtagh and J.L. Starck",
year = "2003",
doi = "10.1016/S0167-8655(03)00038-2",
language = "English",
volume = "24",
pages = "2001--2007",
journal = "Pattern Recognition Letters",
issn = "0167-8655",
publisher = "Elsevier",
number = "12",

}

RIS

TY - JOUR

T1 - Quantization from Bayes factors with application to multilevel thresholding

AU - Murtagh, F.

AU - Starck, J.L.

PY - 2003

Y1 - 2003

KW - Image thresholding

KW - Model selection

KW - Bayes factor

KW - Bayes information criterion

KW - Edge detection

KW - Wavelet transform

U2 - 10.1016/S0167-8655(03)00038-2

DO - 10.1016/S0167-8655(03)00038-2

M3 - Article

VL - 24

SP - 2001

EP - 2007

JO - Pattern Recognition Letters

JF - Pattern Recognition Letters

SN - 0167-8655

IS - 12

ER -