Quantification of Complex Three-dimensional Microstructures by Stereopaired Scanning Electron Imaging and PC-based 3D-Morphometry

B. Minnich, Krautgartner W.D., H. Leeb, E.W.N. Bernroider, A. Lametschwandtner

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationScience, Technology and Education of Microscopy: An Overview
PublisherFORMATEX
Pages706-711
VolumeII
Publication statusPublished - 2002

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