Quantification of Complex Three-dimensional Microstructures by Stereopaired Scanning Electron Imaging and PC-based 3D-Morphometry. / Minnich, B.; W.D., Krautgartner; Leeb, H.; Bernroider, E.W.N.; Lametschwandtner, A.

Science, Technology and Education of Microscopy: An Overview. Vol. II FORMATEX, 2002. p. 706-711.

Research output: Chapter in Book/Report/Conference proceedingChapter

Published
Original languageEnglish
Title of host publicationScience, Technology and Education of Microscopy: An Overview
PublisherFORMATEX
Pages706-711
VolumeII
Publication statusPublished - 2002

ID: 664081