Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology. / He, Hans; Lara-Avila, Samuel; Kim, Kyung Ho; Fletcher, Nick; Rozhko, Sergiy; Bergsten, Tobias; Eklund, Gunnar; Cedergren, Karin; Yakimova, Rositsa; Park, Yung Woo; Tzalenchuk, Alexander; Kubatkin, Sergey.

In: Metrologia, Vol. 56, No. 4, 045004, 28.06.2019.

Research output: Contribution to journalArticlepeer-review

Published

Standard

Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology. / He, Hans; Lara-Avila, Samuel; Kim, Kyung Ho; Fletcher, Nick; Rozhko, Sergiy; Bergsten, Tobias; Eklund, Gunnar; Cedergren, Karin; Yakimova, Rositsa; Park, Yung Woo; Tzalenchuk, Alexander; Kubatkin, Sergey.

In: Metrologia, Vol. 56, No. 4, 045004, 28.06.2019.

Research output: Contribution to journalArticlepeer-review

Harvard

He, H, Lara-Avila, S, Kim, KH, Fletcher, N, Rozhko, S, Bergsten, T, Eklund, G, Cedergren, K, Yakimova, R, Park, YW, Tzalenchuk, A & Kubatkin, S 2019, 'Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology', Metrologia, vol. 56, no. 4, 045004. https://doi.org/10.1088/1681-7575/ab2807

APA

He, H., Lara-Avila, S., Kim, K. H., Fletcher, N., Rozhko, S., Bergsten, T., Eklund, G., Cedergren, K., Yakimova, R., Park, Y. W., Tzalenchuk, A., & Kubatkin, S. (2019). Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology. Metrologia, 56(4), [045004]. https://doi.org/10.1088/1681-7575/ab2807

Vancouver

He H, Lara-Avila S, Kim KH, Fletcher N, Rozhko S, Bergsten T et al. Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology. Metrologia. 2019 Jun 28;56(4). 045004. https://doi.org/10.1088/1681-7575/ab2807

Author

He, Hans ; Lara-Avila, Samuel ; Kim, Kyung Ho ; Fletcher, Nick ; Rozhko, Sergiy ; Bergsten, Tobias ; Eklund, Gunnar ; Cedergren, Karin ; Yakimova, Rositsa ; Park, Yung Woo ; Tzalenchuk, Alexander ; Kubatkin, Sergey. / Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology. In: Metrologia. 2019 ; Vol. 56, No. 4.

BibTeX

@article{764791f33abd4bf1a85ac35b89dcf11a,
title = "Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology",
keywords = "grapheme, measurement standards, molecular doping, quantum Hall effect",
author = "Hans He and Samuel Lara-Avila and Kim, {Kyung Ho} and Nick Fletcher and Sergiy Rozhko and Tobias Bergsten and Gunnar Eklund and Karin Cedergren and Rositsa Yakimova and Park, {Yung Woo} and Alexander Tzalenchuk and Sergey Kubatkin",
year = "2019",
month = jun,
day = "28",
doi = "10.1088/1681-7575/ab2807",
language = "English",
volume = "56",
journal = "Metrologia",
issn = "0026-1394",
publisher = "IOP Publishing Ltd.",
number = "4",

}

RIS

TY - JOUR

T1 - Polymer-encapsulated molecular doped epigraphene for quantum resistance metrology

AU - He, Hans

AU - Lara-Avila, Samuel

AU - Kim, Kyung Ho

AU - Fletcher, Nick

AU - Rozhko, Sergiy

AU - Bergsten, Tobias

AU - Eklund, Gunnar

AU - Cedergren, Karin

AU - Yakimova, Rositsa

AU - Park, Yung Woo

AU - Tzalenchuk, Alexander

AU - Kubatkin, Sergey

PY - 2019/6/28

Y1 - 2019/6/28

KW - grapheme

KW - measurement standards

KW - molecular doping

KW - quantum Hall effect

UR - http://www.scopus.com/inward/record.url?scp=85070555097&partnerID=8YFLogxK

U2 - 10.1088/1681-7575/ab2807

DO - 10.1088/1681-7575/ab2807

M3 - Article

AN - SCOPUS:85070555097

VL - 56

JO - Metrologia

JF - Metrologia

SN - 0026-1394

IS - 4

M1 - 045004

ER -