Original language | English |
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Pages (from-to) | 33742 - 33757 |
Journal | IEEE Access |
Volume | 10 |
DOIs | |
Publication status | Published - 11 Mar 2022 |
New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards
F Thomas-Brans, Thibaut Heckmann, Konstantinos Markantonakis, Damien Sauveron
Research output: Contribution to journal › Article › peer-review