New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards. / Thomas-Brans, F; Heckmann, Thibaut; Markantonakis, Konstantinos; Sauveron, Damien.

In: IEEE Access, Vol. 10, 11.03.2022, p. 33742 - 33757.

Research output: Contribution to journalArticlepeer-review

Published
Original languageEnglish
Pages (from-to)33742 - 33757
JournalIEEE Access
Volume10
DOIs
Publication statusPublished - 11 Mar 2022
This open access research output is licenced under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License.

ID: 44896139