New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards

F Thomas-Brans, Thibaut Heckmann, Konstantinos Markantonakis, Damien Sauveron

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)33742 - 33757
JournalIEEE Access
Volume10
DOIs
Publication statusPublished - 11 Mar 2022

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