New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards. / Thomas-Brans, F; Heckmann, Thibaut; Markantonakis, Konstantinos; Sauveron, Damien.
In: IEEE Access, Vol. 10, 11.03.2022, p. 33742 - 33757.Research output: Contribution to journal › Article › peer-review
Published
| Original language | English |
|---|---|
| Pages (from-to) | 33742 - 33757 |
| Journal | IEEE Access |
| Volume | 10 |
| DOIs | |
| Publication status | Published - 11 Mar 2022 |
This open access research output is licenced under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License.
ID: 44896139