Microstructure of an Artificial Grain-Boundary Weak-Link in an Yba2cu3o7-Delta Thin-Film Grown on a (100)(110), [001]-Tilt Y-Zro2 Bicrystal. / Alarco, J. A.; Olsson, E.; Ivanov, Z. G.; Nilsson, P. A.; Winkler, D.; Stepantsov, E. A.; Tzalenchuk, A. Y.

In: Ultramicroscopy, Vol. 51, No. 1-4, 1993, p. 239-246.

Research output: Contribution to journalArticlepeer-review

Published

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Microstructure of an Artificial Grain-Boundary Weak-Link in an Yba2cu3o7-Delta Thin-Film Grown on a (100)(110), [001]-Tilt Y-Zro2 Bicrystal. / Alarco, J. A.; Olsson, E.; Ivanov, Z. G.; Nilsson, P. A.; Winkler, D.; Stepantsov, E. A.; Tzalenchuk, A. Y.

In: Ultramicroscopy, Vol. 51, No. 1-4, 1993, p. 239-246.

Research output: Contribution to journalArticlepeer-review

Harvard

Alarco, JA, Olsson, E, Ivanov, ZG, Nilsson, PA, Winkler, D, Stepantsov, EA & Tzalenchuk, AY 1993, 'Microstructure of an Artificial Grain-Boundary Weak-Link in an Yba2cu3o7-Delta Thin-Film Grown on a (100)(110), [001]-Tilt Y-Zro2 Bicrystal', Ultramicroscopy, vol. 51, no. 1-4, pp. 239-246.

APA

Alarco, J. A., Olsson, E., Ivanov, Z. G., Nilsson, P. A., Winkler, D., Stepantsov, E. A., & Tzalenchuk, A. Y. (1993). Microstructure of an Artificial Grain-Boundary Weak-Link in an Yba2cu3o7-Delta Thin-Film Grown on a (100)(110), [001]-Tilt Y-Zro2 Bicrystal. Ultramicroscopy, 51(1-4), 239-246.

Vancouver

Alarco JA, Olsson E, Ivanov ZG, Nilsson PA, Winkler D, Stepantsov EA et al. Microstructure of an Artificial Grain-Boundary Weak-Link in an Yba2cu3o7-Delta Thin-Film Grown on a (100)(110), [001]-Tilt Y-Zro2 Bicrystal. Ultramicroscopy. 1993;51(1-4):239-246.

Author

Alarco, J. A. ; Olsson, E. ; Ivanov, Z. G. ; Nilsson, P. A. ; Winkler, D. ; Stepantsov, E. A. ; Tzalenchuk, A. Y. / Microstructure of an Artificial Grain-Boundary Weak-Link in an Yba2cu3o7-Delta Thin-Film Grown on a (100)(110), [001]-Tilt Y-Zro2 Bicrystal. In: Ultramicroscopy. 1993 ; Vol. 51, No. 1-4. pp. 239-246.

BibTeX

@article{d9a95ae2f3a54a54a885dfe786ec61a2,
title = "Microstructure of an Artificial Grain-Boundary Weak-Link in an Yba2cu3o7-Delta Thin-Film Grown on a (100)(110), [001]-Tilt Y-Zro2 Bicrystal",
abstract = "The microstructure of an artificial grain boundary in an YBa2Cu3O7-delta (YBCO) thin film grown on a (100)(110), [001]-tilt yttria-stabilized-zirconia (YSZ) bicrystal substrate has been studied using transmission electron microscopy (TEM). The orientation relationship between the YBCO film and the YSZ substrate was [001]YBCO parallel-to[001]YSZ and [110]YBCO parallel-to[100]YSZ for each half of the bicrystal film. However, the exact boundary geometry of the bicrystal substrate was not transferred to the film. The substrate boundary was straight while the film boundary was wavy. In several cases there was bending of the lattice confined within a distance of a few basal plane lattice spacings from the boundary plane and microfaceting. No intergranular secondary phase was observed but about 25% of the boundary was covered by c-axis-tilted YBCO grains and a-axis-oriented grains, both of which were typically adjacent to CuO grains or surrounded by a thin Cu-rich amorphous layer.",
author = "Alarco, {J. A.} and E. Olsson and Ivanov, {Z. G.} and Nilsson, {P. A.} and D. Winkler and Stepantsov, {E. A.} and Tzalenchuk, {A. Y.}",
year = "1993",
language = "English",
volume = "51",
pages = "239--246",
journal = "Ultramicroscopy",
number = "1-4",

}

RIS

TY - JOUR

T1 - Microstructure of an Artificial Grain-Boundary Weak-Link in an Yba2cu3o7-Delta Thin-Film Grown on a (100)(110), [001]-Tilt Y-Zro2 Bicrystal

AU - Alarco, J. A.

AU - Olsson, E.

AU - Ivanov, Z. G.

AU - Nilsson, P. A.

AU - Winkler, D.

AU - Stepantsov, E. A.

AU - Tzalenchuk, A. Y.

PY - 1993

Y1 - 1993

N2 - The microstructure of an artificial grain boundary in an YBa2Cu3O7-delta (YBCO) thin film grown on a (100)(110), [001]-tilt yttria-stabilized-zirconia (YSZ) bicrystal substrate has been studied using transmission electron microscopy (TEM). The orientation relationship between the YBCO film and the YSZ substrate was [001]YBCO parallel-to[001]YSZ and [110]YBCO parallel-to[100]YSZ for each half of the bicrystal film. However, the exact boundary geometry of the bicrystal substrate was not transferred to the film. The substrate boundary was straight while the film boundary was wavy. In several cases there was bending of the lattice confined within a distance of a few basal plane lattice spacings from the boundary plane and microfaceting. No intergranular secondary phase was observed but about 25% of the boundary was covered by c-axis-tilted YBCO grains and a-axis-oriented grains, both of which were typically adjacent to CuO grains or surrounded by a thin Cu-rich amorphous layer.

AB - The microstructure of an artificial grain boundary in an YBa2Cu3O7-delta (YBCO) thin film grown on a (100)(110), [001]-tilt yttria-stabilized-zirconia (YSZ) bicrystal substrate has been studied using transmission electron microscopy (TEM). The orientation relationship between the YBCO film and the YSZ substrate was [001]YBCO parallel-to[001]YSZ and [110]YBCO parallel-to[100]YSZ for each half of the bicrystal film. However, the exact boundary geometry of the bicrystal substrate was not transferred to the film. The substrate boundary was straight while the film boundary was wavy. In several cases there was bending of the lattice confined within a distance of a few basal plane lattice spacings from the boundary plane and microfaceting. No intergranular secondary phase was observed but about 25% of the boundary was covered by c-axis-tilted YBCO grains and a-axis-oriented grains, both of which were typically adjacent to CuO grains or surrounded by a thin Cu-rich amorphous layer.

M3 - Article

VL - 51

SP - 239

EP - 246

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-4

ER -