Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

Eloise Guen; Pierre Olivier Chapuis; Petr Klapetek; Robb Puttock; Bruno Hay; Alexandre Allard; Tony Maxwell; David Renahy; Miroslav Valtr; Jan Martinek; Séverine Gomès

doi:10.1109/THERMINIC.2018.8593308

Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

Eloise Guen, Pierre Olivier Chapuis, Petr Klapetek, Robb Puttock, Bruno Hay, Alexandre Allard, Tony Maxwell, David Renahy, Miroslav Valtr, Jan Martinek, Séverine Gomès

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-6
Number of pages	6
ISBN (Electronic)	978-1-5386-6759-0
ISBN (Print)	978-1-5386-6760-6
DOIs	https://doi.org/10.1109/THERMINIC.2018.8593308
Publication status	Published - 31 Dec 2018
Event	24th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2018 - Stockholm, Sweden Duration: 26 Sept 2018 → 28 Sept 2018

Publication series

Name	THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings

Conference

Conference	24th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2018
Country/Territory	Sweden
City	Stockholm
Period	26/09/18 → 28/09/18

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10.1109/THERMINIC.2018.8593308

Cite this

Guen, E., Chapuis, P. O., Klapetek, P., Puttock, R., Hay, B., Allard, A., Maxwell, T., Renahy, D., Valtr, M., Martinek, J., & Gomès, S. (2018). Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison. In THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings (pp. 1-6). Article 8593308 (THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/THERMINIC.2018.8593308

Guen, Eloise ; Chapuis, Pierre Olivier ; Klapetek, Petr et al. / Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe : Uncertainty Analysis and Interlaboratory Comparison. THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-6 (THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings).

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title = "Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison",

author = "Eloise Guen and Chapuis, {Pierre Olivier} and Petr Klapetek and Robb Puttock and Bruno Hay and Alexandre Allard and Tony Maxwell and David Renahy and Miroslav Valtr and Jan Martinek and S{\'e}verine Gom{\`e}s",

year = "2018",

month = dec,

day = "31",

doi = "10.1109/THERMINIC.2018.8593308",

language = "English",

isbn = "978-1-5386-6760-6",

series = "THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1--6",

booktitle = "THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings",

address = "United States",

note = "24th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2018 ; Conference date: 26-09-2018 Through 28-09-2018",

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Guen, E, Chapuis, PO, Klapetek, P, Puttock, R, Hay, B, Allard, A, Maxwell, T, Renahy, D, Valtr, M, Martinek, J & Gomès, S 2018, Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison. in THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings., 8593308, THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 1-6, 24th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2018, Stockholm, Sweden, 26/09/18. https://doi.org/10.1109/THERMINIC.2018.8593308

Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison. / Guen, Eloise; Chapuis, Pierre Olivier; Klapetek, Petr et al.
THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-6 8593308 (THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe

T2 - 24th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2018

AU - Guen, Eloise

AU - Chapuis, Pierre Olivier

AU - Klapetek, Petr

AU - Puttock, Robb

AU - Hay, Bruno

AU - Allard, Alexandre

AU - Maxwell, Tony

AU - Renahy, David

AU - Valtr, Miroslav

AU - Martinek, Jan

AU - Gomès, Séverine

PY - 2018/12/31

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U2 - 10.1109/THERMINIC.2018.8593308

DO - 10.1109/THERMINIC.2018.8593308

M3 - Conference contribution

AN - SCOPUS:85061515372

SN - 978-1-5386-6760-6

T3 - THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings

SP - 1

EP - 6

BT - THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 26 September 2018 through 28 September 2018

ER -

Guen E, Chapuis PO, Klapetek P, Puttock R, Hay B, Allard A et al. Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison. In THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-6. 8593308. (THERMINIC 2018 - 24th International Workshop on Thermal Investigations of ICs and Systems, Proceedings). doi: 10.1109/THERMINIC.2018.8593308

Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

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