High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry. / Rosenthal, Martin; Doblas, David; Hernandez, Jaime J.; Odarchenko, Yaroslav I.; Burghammer, Manfred; Di Cola, Emanuela; Spitzer, Denis; Antipov, A. E.; Aldoshin, L. S.; Ivanov, Dimitri A.

In: Journal of synchrotron radiation, Vol. 21, 01.2014, p. 223-228.

Research output: Contribution to journalArticlepeer-review

  • Martin Rosenthal
  • David Doblas
  • Jaime J. Hernandez
  • Yaroslav I. Odarchenko
  • Manfred Burghammer
  • Emanuela Di Cola
  • Denis Spitzer
  • A. E. Antipov
  • L. S. Aldoshin
  • Dimitri A. Ivanov
Original languageEnglish
Pages (from-to)223-228
Number of pages6
JournalJournal of synchrotron radiation
Publication statusPublished - Jan 2014
This open access research output is licenced under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License.

ID: 25149817