Fractal analysis of sampled profiles: Systematic study. / Castelnovo, Claudio; Podesta, Alessandro; Piseri, Paolo; Milani, Paolo.

In: Physical Review E (Statistical, Nonlinear, and Soft Matter Physics), Vol. 65, No. 2, 021601, 02.2002, p. 021601.

Research output: Contribution to journalArticlepeer-review

Published

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Fractal analysis of sampled profiles: Systematic study. / Castelnovo, Claudio; Podesta, Alessandro; Piseri, Paolo; Milani, Paolo.

In: Physical Review E (Statistical, Nonlinear, and Soft Matter Physics), Vol. 65, No. 2, 021601, 02.2002, p. 021601.

Research output: Contribution to journalArticlepeer-review

Harvard

Castelnovo, C, Podesta, A, Piseri, P & Milani, P 2002, 'Fractal analysis of sampled profiles: Systematic study', Physical Review E (Statistical, Nonlinear, and Soft Matter Physics), vol. 65, no. 2, 021601, pp. 021601. https://doi.org/10.1103/PhysRevE.65.021601

APA

Castelnovo, C., Podesta, A., Piseri, P., & Milani, P. (2002). Fractal analysis of sampled profiles: Systematic study. Physical Review E (Statistical, Nonlinear, and Soft Matter Physics), 65(2), 021601. [021601]. https://doi.org/10.1103/PhysRevE.65.021601

Vancouver

Castelnovo C, Podesta A, Piseri P, Milani P. Fractal analysis of sampled profiles: Systematic study. Physical Review E (Statistical, Nonlinear, and Soft Matter Physics). 2002 Feb;65(2):021601. 021601. https://doi.org/10.1103/PhysRevE.65.021601

Author

Castelnovo, Claudio ; Podesta, Alessandro ; Piseri, Paolo ; Milani, Paolo. / Fractal analysis of sampled profiles: Systematic study. In: Physical Review E (Statistical, Nonlinear, and Soft Matter Physics). 2002 ; Vol. 65, No. 2. pp. 021601.

BibTeX

@article{705265881533478aa8353a9fb90f1a1b,
title = "Fractal analysis of sampled profiles: Systematic study",
keywords = "SCANNING-TUNNELING-MICROSCOPY, LONG-RANGE CORRELATIONS, THIN SOLID FILMS, BALLISTIC DEPOSITION, ROUGHNESS EXPONENT, SURFACES, GROWTH, MODEL, DIMENSION, MICROSTRUCTURE",
author = "Claudio Castelnovo and Alessandro Podesta and Paolo Piseri and Paolo Milani",
year = "2002",
month = feb,
doi = "10.1103/PhysRevE.65.021601",
language = "English",
volume = "65",
pages = "021601",
journal = "Physical Review E (Statistical, Nonlinear, and Soft Matter Physics)",
issn = "1539-3755",
publisher = "American Physical Society",
number = "2",

}

RIS

TY - JOUR

T1 - Fractal analysis of sampled profiles: Systematic study

AU - Castelnovo, Claudio

AU - Podesta, Alessandro

AU - Piseri, Paolo

AU - Milani, Paolo

PY - 2002/2

Y1 - 2002/2

KW - SCANNING-TUNNELING-MICROSCOPY

KW - LONG-RANGE CORRELATIONS

KW - THIN SOLID FILMS

KW - BALLISTIC DEPOSITION

KW - ROUGHNESS EXPONENT

KW - SURFACES

KW - GROWTH

KW - MODEL

KW - DIMENSION

KW - MICROSTRUCTURE

U2 - 10.1103/PhysRevE.65.021601

DO - 10.1103/PhysRevE.65.021601

M3 - Article

VL - 65

SP - 021601

JO - Physical Review E (Statistical, Nonlinear, and Soft Matter Physics)

JF - Physical Review E (Statistical, Nonlinear, and Soft Matter Physics)

SN - 1539-3755

IS - 2

M1 - 021601

ER -