Effect of polytetrafluoroethylene (PTFE) phase transition at 19 degrees C on the use of Spectralon as a reference standard for reflectance. / Ball, Christopher P.; Levick, Andrew P.; Woolliams, Emma R.; Green, Paul D.; Dury, Martin R.; Winkler, Rainer; Deadman, Andrew J.; Fox, Nigel P.; King, Martin D.

In: Applied optics, Vol. 52, No. 20, 10.07.2013, p. 4806-4812.

Research output: Contribution to journalArticlepeer-review

Published

Standard

Effect of polytetrafluoroethylene (PTFE) phase transition at 19 degrees C on the use of Spectralon as a reference standard for reflectance. / Ball, Christopher P.; Levick, Andrew P.; Woolliams, Emma R.; Green, Paul D.; Dury, Martin R.; Winkler, Rainer; Deadman, Andrew J.; Fox, Nigel P.; King, Martin D.

In: Applied optics, Vol. 52, No. 20, 10.07.2013, p. 4806-4812.

Research output: Contribution to journalArticlepeer-review

Harvard

Ball, CP, Levick, AP, Woolliams, ER, Green, PD, Dury, MR, Winkler, R, Deadman, AJ, Fox, NP & King, MD 2013, 'Effect of polytetrafluoroethylene (PTFE) phase transition at 19 degrees C on the use of Spectralon as a reference standard for reflectance', Applied optics, vol. 52, no. 20, pp. 4806-4812. https://doi.org/10.1364/AO.52.004806

APA

Ball, C. P., Levick, A. P., Woolliams, E. R., Green, P. D., Dury, M. R., Winkler, R., Deadman, A. J., Fox, N. P., & King, M. D. (2013). Effect of polytetrafluoroethylene (PTFE) phase transition at 19 degrees C on the use of Spectralon as a reference standard for reflectance. Applied optics, 52(20), 4806-4812. https://doi.org/10.1364/AO.52.004806

Vancouver

Author

Ball, Christopher P. ; Levick, Andrew P. ; Woolliams, Emma R. ; Green, Paul D. ; Dury, Martin R. ; Winkler, Rainer ; Deadman, Andrew J. ; Fox, Nigel P. ; King, Martin D. / Effect of polytetrafluoroethylene (PTFE) phase transition at 19 degrees C on the use of Spectralon as a reference standard for reflectance. In: Applied optics. 2013 ; Vol. 52, No. 20. pp. 4806-4812.

BibTeX

@article{b096510193be4ce18846e511df0f01f6,
title = "Effect of polytetrafluoroethylene (PTFE) phase transition at 19 degrees C on the use of Spectralon as a reference standard for reflectance",
abstract = "Sintered polytetrafluoroethylene (PTFE) is highly reflective and is widely used as a reference standard in remote sensing, radiometry, and spectroscopy. The relative change in output flux from a PTFE integrating sphere over the room temperature phase transition at 19°C has been measured at a monochromatic wavelength of 633 nm as 1.82 ± 0.21%. The change in output flux was attributed to a small change of 0.09 ± 0.02% in the total hemispherical reflectance of PTFE, caused by a change in its material density as a result of the phase transition. For the majority of users, this small change measured in total hemi-spherical reflectance is unlikely to impact significantly the accuracy of PTFE flat panel reflectors used as reference standards. However, owing to the multiple reflections that occur inside an integrating sphere cavity, the effect is multiplied and remedial action should be applied, either via a mathematical correction or through temperature stabilization of the integrating sphere when high accuracy (<5%) measurements of flux, irradiance, or radiance are required from PTFE-based integrating spheres at temperatures close to the phase transition at 19°C.",
keywords = "BRDF, CALIBRATION, DIFFUSERS, ALBEDO, SPECTRALON, PTFE, REFLECTANCE",
author = "Ball, {Christopher P.} and Levick, {Andrew P.} and Woolliams, {Emma R.} and Green, {Paul D.} and Dury, {Martin R.} and Rainer Winkler and Deadman, {Andrew J.} and Fox, {Nigel P.} and King, {Martin D.}",
year = "2013",
month = jul,
day = "10",
doi = "10.1364/AO.52.004806",
language = "English",
volume = "52",
pages = "4806--4812",
journal = "Applied optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "20",

}

RIS

TY - JOUR

T1 - Effect of polytetrafluoroethylene (PTFE) phase transition at 19 degrees C on the use of Spectralon as a reference standard for reflectance

AU - Ball, Christopher P.

AU - Levick, Andrew P.

AU - Woolliams, Emma R.

AU - Green, Paul D.

AU - Dury, Martin R.

AU - Winkler, Rainer

AU - Deadman, Andrew J.

AU - Fox, Nigel P.

AU - King, Martin D.

PY - 2013/7/10

Y1 - 2013/7/10

N2 - Sintered polytetrafluoroethylene (PTFE) is highly reflective and is widely used as a reference standard in remote sensing, radiometry, and spectroscopy. The relative change in output flux from a PTFE integrating sphere over the room temperature phase transition at 19°C has been measured at a monochromatic wavelength of 633 nm as 1.82 ± 0.21%. The change in output flux was attributed to a small change of 0.09 ± 0.02% in the total hemispherical reflectance of PTFE, caused by a change in its material density as a result of the phase transition. For the majority of users, this small change measured in total hemi-spherical reflectance is unlikely to impact significantly the accuracy of PTFE flat panel reflectors used as reference standards. However, owing to the multiple reflections that occur inside an integrating sphere cavity, the effect is multiplied and remedial action should be applied, either via a mathematical correction or through temperature stabilization of the integrating sphere when high accuracy (<5%) measurements of flux, irradiance, or radiance are required from PTFE-based integrating spheres at temperatures close to the phase transition at 19°C.

AB - Sintered polytetrafluoroethylene (PTFE) is highly reflective and is widely used as a reference standard in remote sensing, radiometry, and spectroscopy. The relative change in output flux from a PTFE integrating sphere over the room temperature phase transition at 19°C has been measured at a monochromatic wavelength of 633 nm as 1.82 ± 0.21%. The change in output flux was attributed to a small change of 0.09 ± 0.02% in the total hemispherical reflectance of PTFE, caused by a change in its material density as a result of the phase transition. For the majority of users, this small change measured in total hemi-spherical reflectance is unlikely to impact significantly the accuracy of PTFE flat panel reflectors used as reference standards. However, owing to the multiple reflections that occur inside an integrating sphere cavity, the effect is multiplied and remedial action should be applied, either via a mathematical correction or through temperature stabilization of the integrating sphere when high accuracy (<5%) measurements of flux, irradiance, or radiance are required from PTFE-based integrating spheres at temperatures close to the phase transition at 19°C.

KW - BRDF

KW - CALIBRATION

KW - DIFFUSERS

KW - ALBEDO

KW - SPECTRALON

KW - PTFE

KW - REFLECTANCE

U2 - 10.1364/AO.52.004806

DO - 10.1364/AO.52.004806

M3 - Article

VL - 52

SP - 4806

EP - 4812

JO - Applied optics

JF - Applied optics

SN - 1559-128X

IS - 20

ER -