Bayes factors for edge detection from wavelet product spaces

F. Murtagh, J.L. Starck

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Keywords

@article{559a6859dac34f29acd191f6489df8cd,

title = "Bayes factors for edge detection from wavelet product spaces",

keywords = "Interband wavelet, Markov-field, Bayes factors",

author = "F. Murtagh and J.L. Starck",

year = "2003",

month = may,

doi = "10.1117/1.1564104",

language = "English",

volume = "42",

pages = "1375--1382",

journal = "Optical Engineering",

issn = "0091-3286",

publisher = "SPIE",

}