Bayes factors for edge detection from wavelet product spaces. / Murtagh, F.; Starck, J.L.

In: Optical Engineering, Vol. 42, 05.2003, p. 1375-1382.

Research output: Contribution to journalArticle

Published
Original languageEnglish
Pages (from-to)1375-1382
JournalOptical Engineering
Volume42
DOIs
Publication statusPublished - May 2003
This open access research output is licenced under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License.

ID: 890437