A STUDY COMPARING MEASUREMENTS OF ROUGHNESS OF SILICON AND SIO2 SURFACES AND INTERFACES USING SCANNING PROBE MICROSCOPY AND NEUTRON REFLECTIVITY. / CROSSLEY, A ; SOFIELD, C J ; GOFF, J P ; LAKE, A C I ; HUTCHINGS, M T ; MENELLE, A .
In: Journal of non-Crystalline solids, Vol. 187, 07.1995, p. 221-226.Research output: Contribution to journal › Article
Published
| Original language | English |
|---|---|
| Pages (from-to) | 221-226 |
| Number of pages | 6 |
| Journal | Journal of non-Crystalline solids |
| Volume | 187 |
| Publication status | Published - Jul 1995 |
ID: 3075264