A STUDY COMPARING MEASUREMENTS OF ROUGHNESS OF SILICON AND SIO2 SURFACES AND INTERFACES USING SCANNING PROBE MICROSCOPY AND NEUTRON REFLECTIVITY. / CROSSLEY, A ; SOFIELD, C J ; GOFF, J P ; LAKE, A C I ; HUTCHINGS, M T ; MENELLE, A .

In: Journal of non-Crystalline solids, Vol. 187, 07.1995, p. 221-226.

Research output: Contribution to journalArticle

Published
  • A CROSSLEY
  • C J SOFIELD
  • J P GOFF
  • A C I LAKE
  • M T HUTCHINGS
  • A MENELLE
Original languageEnglish
Pages (from-to)221-226
Number of pages6
JournalJournal of non-Crystalline solids
Volume187
Publication statusPublished - Jul 1995

ID: 3075264