Mr Konstantin Kruchinin

  1. Published

    Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution

    Aryshev, A., Ainsworth, R., Aumeyr, T., Bergamaschi, M., Boogert, S., Karataev, P., Kieffer, R., Kruchinin, K., Lefevre, T., Mazzoni, S., Nevay, L., Terunuma, N. & Urakawa, J., 17 Jan 2020, In : Journal of Instrumentation. 15, p. 1-18 18 p., P01020.

    Research output: Contribution to journalArticle