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Three dimensional morphometry in scanning electron microscopy: a technique for accurate dimensional and angular measurements of microstructures using stereopaired digitized images and digital image analysis

  • Bernd Minnich
  • , Hannes Leeb
  • , Edward W.N. Bernroider
  • , A. Lametschwandtner

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)23-34
JournalJournal of Microscopy
Volume195
Issue number1
Publication statusPublished - 1999

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