The influence of interfacial roughness on the coherence of structure and magnetic coupling across barriers in Fe/MgO multilayers

R. Fan, S. J. Lee, J. P. Goff, R. C. C. Ward, S. G. Wang, A. Kohn, C. Wang, A. R. Wildes, S. P. Collins

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number226004
Number of pages5
JournalJournal of Physics: Condensed Matter
Volume22
Issue number22
Early online date20 May 2010
DOIs
Publication statusPublished - 9 Jun 2010

Keywords

  • TUNNEL-JUNCTIONS
  • ROOM-TEMPERATURE
  • MAGNETORESISTANCE
  • ELECTRONICS
  • FE(001)

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