| Original language | English |
|---|---|
| Article number | P01020 |
| Pages (from-to) | 1-18 |
| Number of pages | 18 |
| Journal | Journal of Instrumentation |
| Volume | 15 |
| DOIs | |
| Publication status | Published - 17 Jan 2020 |
Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution
- Alexander Aryshev
- , Rob Ainsworth
- , Thomas Aumeyr
- , Michele Bergamaschi
- , Stewart Boogert
- , Pavel Karataev
- , Robert Kieffer
- , Konstantin Kruchinin
- , Thibaut Lefevre
- , Stefano Mazzoni
- , Laurence Nevay
- , Nobuhiro Terunuma
- , Junji Urakawa
Research output: Contribution to journal › Article › peer-review
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