Sub-micron Scale Transverse Electron Beam Size Diagnostics Methodology Based on the Analysis of Optical Transition Radiation Source Distribution

  • Alexander Aryshev
  • , Rob Ainsworth
  • , Thomas Aumeyr
  • , Michele Bergamaschi
  • , Stewart Boogert
  • , Pavel Karataev
  • , Robert Kieffer
  • , Konstantin Kruchinin
  • , Thibaut Lefevre
  • , Stefano Mazzoni
  • , Laurence Nevay
  • , Nobuhiro Terunuma
  • , Junji Urakawa

Research output: Contribution to journalArticlepeer-review

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Original languageEnglish
Article numberP01020
Pages (from-to)1-18
Number of pages18
JournalJournal of Instrumentation
Volume15
DOIs
Publication statusPublished - 17 Jan 2020

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