Quantification of Complex Three-dimensional Microstructures by Stereopaired Scanning Electron Imaging and PC-based 3D-Morphometry

B. Minnich, Krautgartner W.D., H. Leeb, E.W.N. Bernroider, A. Lametschwandtner

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English
Title of host publication	Science, Technology and Education of Microscopy: An Overview
Publisher	FORMATEX
Pages	706-711
Volume	II
Publication status	Published - 2002

Cite this

@inbook{699f3ca5c1e9444283ca0591d812fd7f,

title = "Quantification of Complex Three-dimensional Microstructures by Stereopaired Scanning Electron Imaging and PC-based 3D-Morphometry",

author = "B. Minnich and Krautgartner W.D. and H. Leeb and E.W.N. Bernroider and A. Lametschwandtner",

year = "2002",

language = "English",

volume = "II",

pages = "706--711",

booktitle = "Science, Technology and Education of Microscopy: An Overview",

publisher = "FORMATEX",

}

TY - CHAP

T1 - Quantification of Complex Three-dimensional Microstructures by Stereopaired Scanning Electron Imaging and PC-based 3D-Morphometry

AU - Minnich, B.

AU - W.D., Krautgartner

AU - Leeb, H.

AU - Bernroider, E.W.N.

AU - Lametschwandtner, A.

PY - 2002

Y1 - 2002

M3 - Chapter

VL - II

SP - 706

EP - 711

BT - Science, Technology and Education of Microscopy: An Overview

PB - FORMATEX

ER -