New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards

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@article{e1122e0908584aecb607767fd6829739,

title = "New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards",

author = "F Thomas-Brans and Thibaut Heckmann and Konstantinos Markantonakis and Damien Sauveron",

year = "2022",

month = mar,

day = "11",

doi = "10.1109/ACCESS.2022.3158958",

language = "English",

volume = "10",

pages = "33742 -- 33757",

journal = "IEEE Access",

issn = "2169-3536",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - New Diagnostic Forensic Protocol for Damaged Secure Digital Memory Cards

AU - Thomas-Brans, F

AU - Heckmann, Thibaut

AU - Markantonakis, Konstantinos

AU - Sauveron, Damien

PY - 2022/3/11

Y1 - 2022/3/11

U2 - 10.1109/ACCESS.2022.3158958

DO - 10.1109/ACCESS.2022.3158958

M3 - Article

SN - 2169-3536

VL - 10

SP - 33742

EP - 33757

JO - IEEE Access

JF - IEEE Access

ER -