High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry

Martin Rosenthal, David Doblas, Jaime J. Hernandez, Yaroslav I. Odarchenko, Manfred Burghammer, Emanuela Di Cola, Denis Spitzer, A. E. Antipov, L. S. Aldoshin, Dimitri A. Ivanov

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)223-228
Number of pages6
JournalJournal of synchrotron radiation
Volume21
DOIs
Publication statusPublished - Jan 2014

Keywords

  • nanocalorimetry
  • modulated differential scanning calorimetry
  • micro-focus X-ray diffraction
  • indium
  • THIN
  • POLYMERS

Cite this