Fractal analysis of sampled profiles: Systematic study

Claudio Castelnovo; Alessandro Podesta; Paolo Piseri; Paolo Milani

doi:10.1103/PhysRevE.65.021601

Fractal analysis of sampled profiles: Systematic study

Claudio Castelnovo
, Alessandro Podesta
, Paolo Piseri
, Paolo Milani

Research output: Contribution to journal › Article › peer-review

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Original language	English
Article number	021601
Pages (from-to)	021601
Number of pages	11
Journal	Physical Review E (Statistical, Nonlinear, and Soft Matter Physics)
Volume	65
Issue number	2
DOIs	https://doi.org/10.1103/PhysRevE.65.021601
Publication status	Published - Feb 2002

Keywords

SCANNING-TUNNELING-MICROSCOPY
LONG-RANGE CORRELATIONS
THIN SOLID FILMS
BALLISTIC DEPOSITION
ROUGHNESS EXPONENT
SURFACES
GROWTH
MODEL
DIMENSION
MICROSTRUCTURE

Access to Document

10.1103/PhysRevE.65.021601

PhysRevEFinal published version, 565 KB

http://pre.aps.org/abstract/PRE/v65/i2/e021601

Cite this

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title = "Fractal analysis of sampled profiles: Systematic study",

keywords = "SCANNING-TUNNELING-MICROSCOPY, LONG-RANGE CORRELATIONS, THIN SOLID FILMS, BALLISTIC DEPOSITION, ROUGHNESS EXPONENT, SURFACES, GROWTH, MODEL, DIMENSION, MICROSTRUCTURE",

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month = feb,

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language = "English",

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AU - Podesta, Alessandro

AU - Piseri, Paolo

AU - Milani, Paolo

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KW - BALLISTIC DEPOSITION

KW - ROUGHNESS EXPONENT

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KW - GROWTH

KW - MODEL

KW - DIMENSION

KW - MICROSTRUCTURE

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DO - 10.1103/PhysRevE.65.021601

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VL - 65

SP - 021601

JO - Physical Review E (Statistical, Nonlinear, and Soft Matter Physics)

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