Fractal analysis of sampled profiles: Systematic study

Claudio Castelnovo, Alessandro Podesta, Paolo Piseri, Paolo Milani

Research output: Contribution to journalArticlepeer-review

40 Downloads (Pure)
Original languageEnglish
Article number021601
Pages (from-to)021601
Number of pages11
JournalPhysical Review E (Statistical, Nonlinear, and Soft Matter Physics)
Volume65
Issue number2
DOIs
Publication statusPublished - Feb 2002

Keywords

  • SCANNING-TUNNELING-MICROSCOPY
  • LONG-RANGE CORRELATIONS
  • THIN SOLID FILMS
  • BALLISTIC DEPOSITION
  • ROUGHNESS EXPONENT
  • SURFACES
  • GROWTH
  • MODEL
  • DIMENSION
  • MICROSTRUCTURE

Cite this