Exchange bias in epitaxial Fe/Ir0.2Mn0.8 bilayers grown on MgO (001)

S. G. Wang; A. Kohn; C. Wang; A. K. Petford-Long; S. Lee; R. Fan; J. P. Goff; L. J. Singh; Z. H. Barber; R. C. C. Ward

doi:10.1088/0022-3727/42/22/225001

Exchange bias in epitaxial Fe/Ir0.2Mn0.8 bilayers grown on MgO (001)

S. G. Wang, A. Kohn, C. Wang, A. K. Petford-Long, S. Lee, R. Fan, J. P. Goff, L. J. Singh, Z. H. Barber, R. C. C. Ward

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	225001
Number of pages	8
Journal	Journal of Physics D: Applied Physics
Volume	42
Issue number	22
DOIs	https://doi.org/10.1088/0022-3727/42/22/225001
Publication status	Published - 21 Nov 2009

Keywords

MAGNETIC TUNNEL-JUNCTIONS
TEMPERATURE-DEPENDENCE
ELECTRON-MICROSCOPY
IRMN/COFE BILAYERS
THIN-FILMS
ANISOTROPY
REVERSAL
INTERFACES
SYSTEM
MODEL

Access to Document

10.1088/0022-3727/42/22/225001

http://iopscience.iop.org/0022-3727/42/22/225001/

Cite this

@article{c0286eae499b4896bde624e09c564cee,

title = "Exchange bias in epitaxial Fe/Ir0.2Mn0.8 bilayers grown on MgO (001)",

keywords = "MAGNETIC TUNNEL-JUNCTIONS, TEMPERATURE-DEPENDENCE, ELECTRON-MICROSCOPY, IRMN/COFE BILAYERS, THIN-FILMS, ANISOTROPY, REVERSAL, INTERFACES, SYSTEM, MODEL",

author = "Wang, \{S. G.\} and A. Kohn and C. Wang and Petford-Long, \{A. K.\} and S. Lee and R. Fan and Goff, \{J. P.\} and Singh, \{L. J.\} and Barber, \{Z. H.\} and Ward, \{R. C. C.\}",

year = "2009",

month = nov,

day = "21",

doi = "10.1088/0022-3727/42/22/225001",

language = "English",

volume = "42",

journal = "Journal of Physics D: Applied Physics",

issn = "0022-3727",

publisher = "Institute of Physics",

number = "22",

}

TY - JOUR

T1 - Exchange bias in epitaxial Fe/Ir0.2Mn0.8 bilayers grown on MgO (001)

AU - Wang, S. G.

AU - Kohn, A.

AU - Wang, C.

AU - Petford-Long, A. K.

AU - Lee, S.

AU - Fan, R.

AU - Goff, J. P.

AU - Singh, L. J.

AU - Barber, Z. H.

AU - Ward, R. C. C.

PY - 2009/11/21

Y1 - 2009/11/21

KW - MAGNETIC TUNNEL-JUNCTIONS

KW - TEMPERATURE-DEPENDENCE

KW - ELECTRON-MICROSCOPY

KW - IRMN/COFE BILAYERS

KW - THIN-FILMS

KW - ANISOTROPY

KW - REVERSAL

KW - INTERFACES

KW - SYSTEM

KW - MODEL

U2 - 10.1088/0022-3727/42/22/225001

DO - 10.1088/0022-3727/42/22/225001

M3 - Article

SN - 0022-3727

VL - 42

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

IS - 22

M1 - 225001

ER -