Abstract
We report on depairing critical currents in submicron YBa2Cu3O7-delta microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I-V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S-S-'-S nature of the small-angle grain boundary junction. (C) 2004 American Institute of Physics.
Original language | English |
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Pages (from-to) | 203-207 |
Number of pages | 5 |
Journal | Low Temperature Physics, Pts A and B |
Volume | 30 |
Issue number | 3 |
Publication status | Published - 2004 |