Current sensing noise thermometry using a low T-c DC SQUID preamplifier

C P  Lusher; J Y  Li; V A  Maidanov; M E  Digby; H  Dyball; A  Casey; J  Nyeki; V V  Dmitriev; B P  Cowan; J  Saunders

doi:10.1007/s10909-014-1147-z

Current sensing noise thermometry using a low T-c DC SQUID preamplifier

C P Lusher
, J Y Li
, V A Maidanov
, M E Digby
, H Dyball
, A Casey
, J Nyeki
, V V Dmitriev
, B P Cowan
, J Saunders

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	115
Number of pages	15
Journal	Measurement Science and Technology
Volume	12
Issue number	1
DOIs	https://doi.org/10.1007/s10909-014-1147-z
Publication status	Published - Jan 2001

Keywords

noise thermometry
millikelvin temperatures
DC SQUID
MILLIKELVIN TEMPERATURES
METALS

Access to Document

10.1007/s10909-014-1147-z

Cite this

@article{3dc7f07f0eeb4d76aa88170272061818,

title = "Current sensing noise thermometry using a low T-c DC SQUID preamplifier",

keywords = "noise thermometry, millikelvin temperatures, DC SQUID, MILLIKELVIN TEMPERATURES, METALS",

author = "Lusher, \{C P\} and Li, \{J Y\} and Maidanov, \{V A\} and Digby, \{M E\} and H Dyball and A Casey and J Nyeki and Dmitriev, \{V V\} and Cowan, \{B P\} and J Saunders",

year = "2001",

month = jan,

doi = "10.1007/s10909-014-1147-z",

language = "English",

volume = "12",

pages = "115",

journal = "Measurement Science and Technology",

issn = "1361-6501",

publisher = "IOP Publishing Ltd.",

number = "1",

}

TY - JOUR

T1 - Current sensing noise thermometry using a low T-c DC SQUID preamplifier

AU - Lusher, C P

AU - Li, J Y

AU - Maidanov, V A

AU - Digby, M E

AU - Dyball, H

AU - Casey, A

AU - Nyeki, J

AU - Dmitriev, V V

AU - Cowan, B P

AU - Saunders, J

PY - 2001/1

Y1 - 2001/1

KW - noise thermometry

KW - millikelvin temperatures

KW - DC SQUID

KW - MILLIKELVIN TEMPERATURES

KW - METALS

U2 - 10.1007/s10909-014-1147-z

DO - 10.1007/s10909-014-1147-z

M3 - Article

SN - 1361-6501

VL - 12

SP - 115

JO - Measurement Science and Technology

JF - Measurement Science and Technology

IS - 1

ER -