| Original language | English |
|---|---|
| Pages (from-to) | 1375-1382 |
| Journal | Optical Engineering |
| Volume | 42 |
| DOIs | |
| Publication status | Published - May 2003 |
Keywords
- Interband wavelet
- Markov-field
- Bayes factors
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Bayes factors for edge detection from wavelet product spaces
- F. Murtagh
- , J.L. Starck
Research output: Contribution to journal › Article
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